Monolithic power monitor and wavelength detector

ABSTRACT

Monolithic single and/or dual detector structures are fabricated on the emitting surface of a VCSEL and/or on a lens or glass substrate configured to be positioned along the axis of emission of an optical light source. Each monolithic detector structure includes one or two PIN detectors fabricated from amorphous silicon germanium with carbon doping or amorphous germanium with hydrogen doping. The monolithic detectors may additionally include various metallization layers, buffer layers, and/or anti-reflective coatings. The monolithic detectors can be grown on 1550 NM VCSELs used in optical transmitters, including lasers with managed chirp and TOSA modules, to reduce power and real estate requirements of the optical transmitters, enabling the optical transmitters to be implemented in long-reach SFP+ transceivers.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.12/026,368 filed on Feb. 5, 2008, titled MONOLITHIC POWER MONITOR ANDWAVELENGTH DETECTOR, the contents of the application is herebyincorporated herein by reference in its entirety.

BACKGROUND OF THE INVENTION

1. The Field of the Invention

The present invention relates generally to optoelectronic devices. Morespecifically, the present invention relates to monolithic single anddual detector structures for use with optoelectronic devices.

2. The Relevant Technology

Computing, telecom and networking technology have transformed our world.As the amount of information communicated over networks has increased,high speed transmission has become ever more critical. Many high speeddata transmission networks rely on optical transceivers and similardevices for facilitating transmission and reception of digital dataembodied in the form of optical signals over optical fibers. Opticalnetworks are thus found in a wide variety of high speed applicationsranging from modest Local Area Networks (“LANs”) to backbones thatdefine a large portion of the infrastructure of the Internet.

Typically, data transmission in such networks is implemented by way ofan optical light source, such as a laser or Light Emitting Diode(“LED”). The optical light source emits light when current is passedthrough it, the intensity of the emitted light being a function of themagnitude of the current. Data reception is generally implemented by wayof an optical receiver (also referred to as an optoelectronictransducer), an example of which is a photodiode. The optoelectronictransducer receives light and generates a current, the magnitude of thegenerated current being a function of the intensity of the receivedlight.

In certain optical network applications, such as dense wavelengthdivision multiplexing (“DWDM”) networks, it may be desirable to monitorthe optical output power and/or wavelength of light signals emitted bythe optical light source. If the output power and/or emission wavelengthare above or below a desired power and/or wavelength, a feedback loopcan then be used to increase or decrease the appropriate parameter.

In a conventional monitoring arrangement used with edge emitting opticallight sources (e.g., distributed feedback lasers, and the like), a powermonitor photodiode is placed behind the back facet of the edge emitter.Although most of the light emitted by the edge emitter escapes throughthe front facet of the edge emitter, a proportional amount of light alsoescapes through the back facet. Some of the light emitted through theback facet is then absorbed by the power monitor photodiode, generatinga current in the power monitor photodiode that is proportional to theabsorbed light. The magnitude of the photocurrent generated by the powermonitor photodiode can be used to measure the optical output power ofthe edge emitter.

The wavelength of the light emitted by the edge emitter can be measuredusing a beam splitter, a second monitor photodiode, and a narrowbandpass wavelength filter. The beam splitter is typically placed infront of the front facet of the edge emitter, allowing most of the lightemitted by the edge emitter to pass through, while redirecting aproportional amount of the emitted light through the wavelength filterto the second monitor photodiode.

Similar to the power monitor photodiode, the second monitor photodiodegenerates a current proportional to the light absorbed by the secondmonitor photodiode. However, the amount of light that reaches the secondmonitor photodiode through the wavelength filter depends on both theinitial optical output power (which can be measured by the power monitorphotodiode) and the wavelength of the emitted light. The closer theemission wavelength is to the bandpass of the wavelength filter, thegreater the amount of light that passes through the wavelength filter tothe second monitor photodiode. Consequently, a ratio of the currentsgenerated by the power monitor photodiode and the second monitorphotodiode can be used to determine the wavelength of the light emittedby the edge emitter. In many cases, this determination is accomplishedby looking up the ratio in a lookup table or calibration file.

Although beneficial for power and wavelength monitoring and control,conventional monitoring devices suffer from a number of disadvantages.First, conventional monitoring devices involve numerous discrete opticalcomponents that require significant real estate in an optical lightsource package. Additionally, the cost of the discrete opticalcomponents required for monitoring power and/or wavelength increases thematerial cost of optical light source packages in which they used.Moreover, the difficulties in properly aligning the discrete opticalcomponents increase the complexity and cost of manufacturing the opticallight source packages that include such components.

The subject matter claimed herein is not limited to embodiments thatsolve any disadvantages or that operate only in environments such asthose described above. Rather, this background is only provided toillustrate one exemplary technology area where some embodimentsdescribed herein may be practiced

BRIEF SUMMARY OF THE INVENTION

These and other limitations are overcome by embodiments of the inventionwhich relate to systems and methods for monitoring the output powerand/or wavelength of light emitted by an optical light source. Brieflysummarized, embodiments of the invention are directed to a monolithicdual detector structure or separate monolithic detector structuresoccupying much less real estate than conventional discrete componentsused for power and/or wavelength monitoring. The monolithic detectorstructure(s) can be economically mass-produced using low-costfabrication techniques on the emitting surface of a 1550 NM VCSELtransmitter, on an optical lens to be positioned in front of an opticallight source, on a glass substrate to be positioned between an opticallight source and an optical lens, or the like or any combinationthereof.

In one embodiment, the dual monolithic detector structure includes twoseparate PIN detectors separated by a wavelength filter. Each of the PINdetectors may include an amorphous material such as amorphous silicongermanium with carbon doping or amorphous germanium with hydrogendoping, which can additionally be doped with phosphorus for enhancedresponsivity. The amorphous material is selectively doped to form thePIN structure. Each PIN detector may further include metallizationlayers made of a transparent metal such as indium zinc oxide, indium tinoxide, or the like. It is appreciated that in this embodiment,additional calibration of the device may be required to account forback-reflected light from the wavelength filter influencing the responseof the first monolithic photodetector in this particular embodiment.

The monolithic detector structure may further include a first bufferlayer that is deposited on the VCSEL emitting surface, optical lens orglass substrate before forming the first PIN detector, and a secondbuffer layer that is deposited on the wavelength filter. The first andsecond buffer layers may include, for instance, polyimide, siliconoxide, or nitride. The monolithic detector structure may further includeone or more anti-reflective coatings to reduce back reflections as lightis received at the monolithic detector structure.

According to one embodiment, separate monolithic detector structures areimplemented in a laser with managed chirp that includes an optical lightsource configured to emit light in the 1550 nanometer range, an opticalspectrum reshaper, and the monolithic detector structures. Each of theoptical light source and the optical spectrum reshaper are coupled to adifferent thermo electric cooler (“TEC”) configured to control therespective temperatures of the optical light source and optical spectrumreshaper. The optical light source may comprise a 1550 NM VCSEL with themonolithic power detector structure grown on the emitting surfacethereof and the monolithic wavelength detector structure grown on anoptical lens following the optical spectrum reshaper. This enables a TECdriver to be integrated within the package of the laser with managedchirp. Further, because the laser with managed chirp uses a 1550 NMVCSEL, it can be implemented in a long reach SFP+ transceiver thatincludes a CDR for signal equalization.

Additional features and advantages of the invention will be set forth inthe description which follows, and in part will be obvious from thedescription, or may be learned by the practice of the invention. Thefeatures and advantages of the invention may be realized and obtained bymeans of the instruments and combinations particularly pointed out inthe appended claims. These and other features of the present inventionwill become more fully apparent from the following description andappended claims, or may be learned by the practice of the invention asset forth hereinafter.

BRIEF DESCRIPTION OF THE DRAWINGS

To further clarify the above and other advantages and features of thepresent invention, a more particular description of the invention willbe rendered by reference to specific embodiments thereof which areillustrated in the appended drawings. It is appreciated that thesedrawings depict only typical embodiments of the invention and aretherefore not to be considered limiting of its scope. The invention willbe described and explained with additional specificity and detailthrough the use of the accompanying drawings in which:

FIG. 1 schematically illustrates an example optical transceiver that mayimplement features of the present invention;

FIG. 2A schematically illustrates one embodiment of a laser with managedchirp that includes a 1550 NM VCSEL and incorporates separateVCSEL-mounted & lens-mounted monolithic detector structures for opticalpower and wavelength monitoring;

FIG. 2B schematically illustrates a second embodiment of a laser withmanaged chirp that includes a DFB laser and incorporates separatelens-mounted monolithic detector structures for optical power andwavelength monitoring;

FIG. 2C schematically illustrates a conventional transmitter opticalsubassembly (“TOSA”) that includes a 1550 NM VCSEL and incorporates aVCSEL-mounted monolithic dual detector structure for both optical powerand wavelength monitoring.

FIGS. 3A and 3B schematically illustrate embodiments of a monolithicdual detector structure according to the invention that are fabricatedon a 1550 nm VCSEL; and

FIG. 4 schematically illustrates one embodiment of a compact laser withmanaged chirp that incorporates a monolithic optical filter sandwichedwithin a monolithic dual detector structure according to the invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Embodiments of the invention relate to systems and methods for providingoptical power and/or wavelength monitoring in optoelectronic devicesusing monolithic single and/or dual detector structures. The monolithicdetector structures according to embodiments of the invention can befabricated in the emission path of a light source such as a verticalcavity surface emitting laser (“VCSEL”), a distributed feedback (“DFB”)laser, and the like. In particular, a monolithic detector structure maybe fabricated on the emitting surface of a VCSEL, on an optical lensfollowing an optical light source, on a substrate between an opticallight source and an optical lens, and the like or any combinationthereof.

According to one embodiment, a dual detector structure is fabricated onthe emitting surface of a 1550 NM VCSEL implemented within aconventional TOSA. Alternately or additionally, a monolithic powerdetector structure can be fabricated on the emitting surface of a VCSELor on a first optical lens following a DFB laser, either of which can beimplemented within a laser with managed chirp, while a monolithicwavelength detector structure may be fabricated on a second optical lensfollowing the OSR of the laser with managed chirp. Embodiments of alaser with managed chirp will be described below.

Each detector structure can include single or dual detectors comprisingone or more of amorphous silicon germanium with carbon doping(a-SiGe:C), and amorphous germanium with hydrogen doping (a-Ge:H);a-Ge:H detectors can additionally be doped with phosphorous for enhancedresponsivity. The detector structures according to embodiments of theinvention can be used with light sources emitting light at or aroundparticular wavelengths and are substantially transparent to the emittedlight. However, the coefficient of absorption of the detector structuresis still high enough for the detector structures to capture some of theemitted light for monitoring purposes. Advantageously, the detectorstructures according to embodiments of the invention occupy less spaceand cost less money to fabricate than traditional power and wavelengthdetectors.

The present invention can be implemented in various optoelectronicdevices. As used herein, the term “optoelectronic device” includesdevices having both optical and electrical components. Examples ofoptoelectronic devices include, but are not limited to transponders,transceivers, transmitters, and/or receivers. Optoelectronic devices canbe used, for instance, in telecommunications networks, local areanetworks, metro area networks, storage area networks, wide areanetworks, and the like. The principles of the present invention may beimplemented in optoelectronic devices of any form factor currentlyavailable or that may be developed in the future, including SFF, SFP,XFP, 300-pin, without restriction. It will be appreciated, however, thatthe optoelectronic devices need not comply with standardized form factorrequirements and may have any size or configuration necessary accordingto a particular design. The principles of the present invention aresuitable for 1G, 2G, 4G, 10G and higher bandwidth fiber channels

FIG. 1 schematically illustrates an example optical transceiver module100 in which the principles of the present invention may be employed.The optical transceiver 100 includes a receiver 101, post-amplifier 102,laser driver 103, transmitter 104, microcontroller 105, and persistentmemory 106. The principles of the present invention enable the use ofspace- and cost-efficient detector structures to monitor the opticalpower and/or wavelength of light emitted by the light source 104. Whilethe optical transceiver and the transmitter 104 will be described insome detail, they are described by way of illustration only, and not byway of restricting the scope of the invention.

In operation, the optical transceiver 100 receives an optical signalusing optical receiver 101. The receiver 101 acts as an opto-electrictransducer by transforming the optical signal into an electrical signal.The receiver 101 provides the resulting electrical signal to apost-amplifier 102. The post-amplifier 102 amplifies the signal andprovides the amplified signal to a host 111 as represented by arrow102A. The host 111 may be any computing system capable of communicatingwith the optical transceiver 100.

The optical transceiver 100 may also receive electrical signals from thehost 111 for transmission as optical signals. Specifically, the laserdriver 103 receives an electrical signal from the host 111, asrepresented by the arrow 103A, and drives the optical transmitter 104 toemit an optical signal. The transmitter 104 includes a suitable lightsource, such as a VCSEL, DFB laser, or the like, that is driven by theelectrical signals provided by the host 111, thereby causing the lightsource to emit optical signals representative of the information carriedin the electrical signal. Accordingly, the optical transmitter 104serves as an electro-optic transducer.

The behavior of the optical receiver 101, the post-amplifier 102, thelaser driver 103, and the optical transmitter 104 may vary dynamicallydue to a number of factors. For example, temperature changes, powerfluctuations, and feedback conditions may each affect the performance ofthese components. Accordingly, the transceiver 100 includes amicrocontroller 105, which may evaluate environment conditions, such astemperature, and/or operating conditions, such as emitted optical powerand/or wavelength, and receive information from the post-amplifier 102(as represented by arrow 105A) and from the laser driver 103 (asrepresented by arrow 105B). This allows the microcontroller 105 tooptimize the dynamically varying performance of the transceiver 100.Specifically, the microcontroller 105 may optimize the operation of thetransceiver 100 by adjusting settings on the post-amplifier 102 and/orthe laser driver 103 as represented by the arrows 105A and 105B.

For instance, in one embodiment, the optical transceiver 100 isimplemented in a network in which constant optical power, constantwavelength, or both, are desired for operation. For example, the opticaltransceiver 100 may be implemented in a network that uses densewavelength division multiplexing (“DWDM”) to couple light signals frommultiple transmitters into a single optical fiber. In this case,maintaining the light signal emitted by the transceiver 100 at constantpower and wavelength is critical to the proper operation of the DWDMnetwork. Accordingly, the present embodiment uses a monolithic dualdetector (or separate single detectors) to monitor optical power andwavelength of the emitted signal. In particular, the dual detector (orseparate single detectors) generates two photocurrents indicative of theoptical power and wavelength of the emitted signal. After determiningvalues for these two photocurrents, the microcontroller 105 can use alookup table or calibration file to determine the optical power andwavelength of the emitted signal. If the optical power and/or wavelengthare not at the desired values, the microcontroller 105 can adjustsettings on the laser driver 103 and/or transmitter 104 to correcteither one or both.

The microcontroller 105 may have access to a persistent memory 106,which in one embodiment is an Electrically Erasable and ProgrammableRead Only Memory (“EEPROM”). Persistent memory 106 may also be any othernon-volatile memory source. The persistent memory 106 and the controlmodule 105 may be packaged together in the same package or in differentpackages without restriction. In one embodiment, the persistent memory106 stores the lookup table and/or calibration file for determiningpower and/or wavelength.

Data and clock signals may be provided from the host 111 to themicrocontroller 105 using the serial clock line SCL, and the serial dataline SDA. Also, data may be provided from the microcontroller 105 to thehost 111 using the serial data line SDA. Alternately or additionally,any suitable interface may be implemented for communication between thehost 111 and microcontroller 105, such as I²C (as illustrated), MDIO,SPI, and the like or any combination thereof.

Turning now to FIG. 2A, one embodiment of an optical transmitter insimplified block form is illustrated that implements separate monolithicoptical power and wavelength detectors according to the invention. Asillustrated, the optical transmitter 200 comprises a laser with managedchirp, conventional embodiments of which are disclosed in U.S. patentapplication Ser. No. 10/289,944, filed Nov. 6, 2002 and entitled POWERSOURCE FOR A DISPERSION COMPENSATION FIBER OPTIC SYSTEM, whichapplication is herein incorporated by reference in its entirety.Embodiments of a laser with managed chirp are marketed by the FinisarCorporation as Chirp Managed Laser CML™ transmitters.

Briefly, a conventional laser with managed chirp comprises a lightsource and an optical spectrum reshaper (“OSR”) or optical discriminatorand may optionally include one or more thermo electric coolers (“TECs”),thermistors, a beam splitter and two monitor photodiodes. An opticalisolator is also often deployed before the OSR, depending on thereflection characteristics of the OSR. As will be described more fullybelow, the beam splitter and photodiodes may be required to monitor thepower and wavelength of light emitted by the light source for properfunctioning of the laser with managed chirp. However, these componentsrequire a significant amount of real estate in the package of the laserwith managed chirp. Further, inclusion of these components in thepackage increases the cost of and complicates the package manufacturingprocess (e.g., these components must be manufactured/purchased and thenbe properly aligned within the package).

Accordingly, the transmitter 200 in the present embodiment includesfirst and second monolithic detector structures 206, 207 for opticalpower and wavelength monitoring, respectively, thereby eliminating theneed for the discrete photodiode and beam splitter components. In moredetail, and as illustrated, the optical transmitter 200 includes a 1550NM VCSEL light source 202 coupled to a first thermo electric cooler(“TEC”) 204 for temperature control of the VCSEL 202, with the firstmonolithic detector structure 206 grown on the emitting surface of theVCSEL 202. The transmitter 200 further includes a first optical lens 208and optical spectrum reshaper 210 disposed along the axis of lightemission of the VCSEL 202. The OSR 210 is additionally coupled to asecond TEC 208 for temperature control of the OSR 210. A second opticallens 209 is disposed along the axis of light emission following the OSR210. The second monolithic detector 207 is grown on the input surface ofthe second optical lens 209 and is used to monitor the transmittedoptical power while the second lens 209 couples the light into opticalfiber. In one embodiment, the OSR 210 comprises a multi-cavity etalonfilter. Two thermistors 214, 216 may be provided for measuring thetemperature of the VCSEL 202 and OSR 210, respectively.

As the name implies, a laser with managed chirp manages the chirp of anoptical light source to optimize a signal produced by the light source.In particular, when a semiconductor light source, such as a VCSEL orDFB, is directly modulated, adiabatic chirp causes 1 bits to beblue-shifted relative to 0 bits. The optical transmitter 200 exploitsthe wavelength difference between the 1 bits and 0 bits to increase theextinction ratio of the light signal emitted by the VCSEL 202.

In particular, the extinction ratio of an emitted light signal can beincreased using the OSR 210. The OSR 210 is a filter with a transmissionwindow configured to discriminate between blue-shifted 1 bits andred-shifted 0 bits. Consequently, the OSR 210 can transmit 1 bits withlittle or no loss while attenuating 0 bits to increase the extinctionratio of the signal.

Advantageously, adiabatic chirp, together with the OSR 210, introducesphase correlation between the bits, which increases dispersion toleranceand reduces the information bandwidth by a factor of two. Consider a “10 1” bit sequence at 10G where 1 bits have 5 GHz higher frequency than 0bits. The phase of the carrier slips by 2π×5 GHz×100 ps=π during the 0bit, making the second 1 bit it out of phase with the first. Normallydispersion closes the eye by spreading the energy of the 1 bits intoadjacent 0 bits. Here, the 1 bits interfere destructively in the middle0 bit because of the it phase shift, keeping the eye open after fiberpropagation.

The VCSEL 202 and OSR 210 are active elements that vary in temperatureduring operation. In the case of the VCSEL 202, variations intemperature cause changes to the wavelength of light signals emitted bythe VCSEL 202. In the case of the OSR 210, temperature variations causechanges to the OSR's transmission window. As a result, proper operationof the optical transmitter 200 can require matching the emissionwavelength of the VCSEL 202 to the transmission window of the OSR 210.In addition to matching the emission wavelength to the transmissionwindow, it may be necessary to maintain the emitted light at constantpower and wavelength. To this end, the optical transmitter 200 includesTECs 204, 212 for controlling the temperatures of the VCSEL 202 and OSR210, and the monolithic detector structures 206, 207 for measuring theoutput power and wavelength of emitted light.

As previously indicated, the first detector structure 206 is configuredto monitor optical power and the second detector structure 207 isconfigured to monitor wavelength in conjunction with the OSR, the OSRcomprising a periodic structure. In another embodiment, the first andsecond detectors can be jointly implemented in a monolithic dualdetector structure that includes a periodic structure separate from theOSR. The first and second detectors are made from materials suited forlight in the 1550 NM range, which includes light from 1520 NM to 1570 NM(generally referred to herein as “1550 NM light”). Consequently, the twodetectors are substantially transparent to 1550 NM light, although theyhave coefficients of absorption for 1550 NM light that are high enoughto capture a small amount of the emitted light and produce photocurrentsrepresentative thereof. The periodic structure—whether included in theOSR and/or in a dual monolithic detector structure—is attuned for aparticular wavelength in the 1550 NM range. The transmissivity of theOSR/periodic structure depends on the emission wavelength and is mosttransmissive for light at the particular wavelength.

When light is emitted by the VCSEL 202, it passes through the first andsecond detector structures 206, 207. In particular, upon passing throughthe first detector 206, the first detector generates a photocurrentrepresentative of the optical power of the emitted light. The emittedlight then propagates through the first optical lens 208 beforepropagating towards the OSR 210. The optical transmitter 200 mayoptionally include an optical isolator component 211 through which thelight propagates before propagating through the OSR 210. Light emergingfrom the OSR 210 then passes through the second monolithic detector 207before the second optical lens 209 focuses the light into an opticalfiber.

Because the OSR 210 (or other periodic structure) is attuned to aparticular wavelength, the amount of light that propagates through theOSR depends on the wavelength of the light signal. Accordingly, thesecond detector 207 also generates a photocurrent, the magnitude ofwhich depends on both the initial optical power and the wavelength ofthe emitted light signal. In one embodiment of the invention, thephotocurrents from the first and second detectors can be provided to amicrocontroller which can determine the emission wavelength using alookup table and the photocurrents.

FIG. 2B illustrates a second embodiment of an optical transmitter250—also comprising a laser with managed chirp—that implements separatemonolithic optical power and wavelength detectors according toembodiments of the invention. The transmitter 250 is similar in manyrespects to the transmitter 200 of FIG. 2A. In particular, thetransmitter 250 includes a light source 252 coupled to a first TEC 254,a first optical lens 256, a first monolithic detector structure 258, anoptional optical isolator 259, an OSR 260 coupled to a second TEC 262,two thermistors 264, 266, a second monolithic detector structure 267,and a second optical lens 268. However, in the embodiment of FIG. 2B thelight source 252 comprises a DFB laser and the first detector structure258 is grown on the first lens 256, rather than on the light source 252.The operation of the optical transmitter 250 is similar to that of thetransmitter 200 and can be understood with reference to the explanationprovided above with regard to the transmitter 200.

FIG. 2C illustrates a third embodiment of an optical transmitter270—comprising a TOSA—that implements a monolithic dual detectorstructure according to embodiments of the invention. The TOSA 270 issimilar in some respects to the transmitter 200 of FIG. 2A. Forinstance, the TOSA 270 includes a VCSEL light source 272 coupled to aTEC 274, a first optical lens 276, an optional optical isolator 278, athermistor 284, and a second optical lens 288. However, in theembodiment of FIG. 2C the transmitter 270 lacks an OSR, secondthermistor, and second TEC. Additionally, the transmitter 270 includes adual power and wavelength detector structure 290 on the surface of theVCSEL 272 rather than having separate power and wavelength detectorstructures on the VCSEL 272 and second lens 288, respectively, as in theembodiment of FIG. 2A. Embodiments of a dual power and wavelengthdetector structure are described in greater detail below with respect toFIGS. 3A and 3B.

In the embodiment of FIG. 2C, the dual detector 290 includes a periodicstructure attuned to a particular wavelength of 1550 NM light. Theperiodic structure is sandwiched between a power detector at the inputof the dual detector 290 and a wavelength detector at the output of thedual detector 290. Consequently, when 1550 NM light is emitted by theVCSEL 272, the power detector generates a photocurrent representative ofthe optical power of the emitted light, while the wavelength detectorgenerates a photocurrent representative of the wavelength of the emittedlight. As in the embodiments already described, the photocurrents fromthe power and wavelength detectors can be provided to a microcontrollerand used to determine the optical power and wavelength of the emittedlight.

It is appreciated that the embodiments of FIGS. 2A-2C are illustrativeonly and that variations are contemplated to be within the scope of theinvention. For instance, while the monolithic single and/or dualdetector structures have been illustrated and described as being grownon a VCSEL's emitting surface and/or on one or more lenses implementedin conjunction with a laser with managed chirp, the detector structurescould alternately or additionally be grown on other optical lenses inconjunction with a laser with managed chirp or other opticaltransmitters, on glass substrates placed between optical lenses and DFB,VCSEL, or other light sources, and the like or any combination thereof.

In one embodiment of the invention, monolithic single or dual detectorstructures enable a 1550 NM VCSEL light source to be implemented inapplications that incorporate a laser with managed chirp as a low poweralternative to a DFB laser for use in small form factor platforms suchas SFP+. In particular, VCSELs require about 30 mA for operationcompared to about 120 mA for a DFB laser. Advantageously, the reducedpower requirements of a VCSEL increase the remaining power budget forthe transceiver as a whole. In one embodiment, the increased remainingpower budget can be used to operate a CDR for electrical signalequalization on the transmit side of the transceiver, enabling use ofthe optical transceiver in long reach applications. Further, as will beexplained in the following paragraphs, use of monolithic single or dualdetector structures vacates real estate within the laser with managedchirp, which ultimately results in room becoming available for the CDRwithin the transceiver.

As already mentioned above, replacing the discrete components used forpower and wavelength monitoring with monolithic single or dual detectorstructures vacates real estate in an optical transmitter package for alaser with managed chirp (or other optical package, such as a TOSA).Thus, the size of the transmitter package can be reduced. Alternately oradditionally, the vacated real estate can be used for an integrated TECdriver or other components. Embodiments of a TOSA with an integrated TECdriver are described in U.S. Provisional Patent Application Ser. No.60/986,356, filed Nov. 8, 2007 and entitled TRANSMITTER OPTICALSUB-ASSEMBLY WITH INTEGRAL THERMOELECTRIC COOLER DRIVER, which is hereinincorporated by reference in its entirety. While the 60/986,356application discusses integration of the TEC driver within a TOSA, theprinciples of that invention can alternately or additionally be appliedto integrate the TEC driver inside a laser with managed chirp as well.

In any event, placing the TEC driver inside the laser with managed chirp(or TOSA), rather than in its conventional location on the printedcircuit board (“PCB”) of the transceiver, vacates room on the PCB forthe CDR. Alternately or additionally, the size of the package for thelaser with managed chirp can be reduced, allowing the PCB to be enlargedto accommodate the CDR. In conclusion, then, use of a VCSEL withmonolithic single or dual detector structures inside a laser withmanaged chirp or a TOSA vacates real estate within and reduces powerrequirements of the laser with managed chirp or TOSA, thereby enablingplacement and operation of a CDR inside an SFP+ transceiver while stillmeeting the size and power budget requirements of the SFP+ form factor.

Alternately or additionally, monolithic single or dual detectorstructures can be implemented inside a laser with managed chirp, TOSA,or TOSA-like device that includes one or more integrated electroniccomponents such as a CDR, driver, and microcontroller. Embodiments of aTOSA-like device that includes one or more integrated electroniccomponents are described more fully in U.S. patent application Ser. No.11/968,581, filed Jan. 2, 2008, and entitled INTELLIGENT TRANSMITTERMODULE, which application is herein incorporated by reference in itsentirety.

With reference now to FIG. 3A, one embodiment of a monolithic dualdetector structure 300 is illustrated, which may correspond to themonolithic dual detector 290 of FIG. 2C. The detector structure 300 canbe fabricated on a VCSEL emitter surface or on a glass substrate such asa lens using low temperature deposition techniques including plasmaenhanced chemical vapor deposition (“PECVD”) and/or metal organic CVD(“MOCVD”). FIG. 3A illustrates a cross-sectional simplified blockdiagram of one monolithic dual detector structure 300. It isappreciated, however, that such structures can be mass produced usingwell-known fabrication techniques.

As shown, the detector structure 300 is fabricated or grown on theemitting surface of a VCSEL 301. However, the detector structure canalternately be grown on a glass substrate for placement along the axisof emission of a light source between the light source and an opticallens, or along the axis of emission on the optical lens itself.

The detector structure 300 includes a first buffer layer 302, a firstdetector 304 on the first buffer layer 302, a periodic structure 308 onthe first detector 304, a second buffer layer 306 on the periodicstructure 308, and a second detector 310 on the second buffer layer 306.The first detector 304 comprises a PIN layer or junction 312 andmetallization layers 316 and 318 while the second detector 310 comprisesa PIN layer or junction 314 and metallization layers 320 and 322. Notethat the periodic structure 308 acts as the OSR described in FIGS. 2A-2Bwith respect to the wavelength detecting function.

In one embodiment, the monolithic detector structure 300 may bemass-produced on a wafer of 1550 NM VCSELs (or on a glass substrate orwafer of lenses) as follows. First, the wafer 301 is masked fordeposition of a first buffer layer 302 on the surface of the VCSEL wafer301. Alternately or additionally, when the detector structure 300 isgrown on a lens or glass substrate, deposition of the first buffer layer302 can be omitted. The first buffer layer 302 may comprise polyimide,silicon oxide, nitride, or some other inert buffer material. The maskpattern ensures that the polyimide 302 is only deposited on areas of thesurface of the wafer that are above the active region of each VCSEL inthe wafer. The wafer is masked again and a transparent metal contact316, such as indium zinc oxide (“IZO”), indium tin oxide (“ITO”), or thelike, is deposited on the buffer layer 302. It is understood that thisand other metallization layers described herein are thin and comprisetransparent metal, such as IZO or ITO, to avoid interfering withtransmission of light through the detector structure 300.

A PIN layer or junction 312 is next deposited on the metallization layer316 using a low temperature deposition technique, such as PECVD.According to embodiments of the invention, the PIN layer or junctioncomprises a-SiGe:C, or a-Ge:H that is selectively doped to create thePIN structure 312. The PIN layer or junction 312 may optionally be dopedfurther with phosphorous to enhance responsivity. Note that the seconddetector 310 comprises the same material as the first detector 304 andmay be fabricated in the same way. Advantageously, the amorphous natureof these materials allows fabrication of the monolithic detectorstructure 300 on various surfaces such as semiconductor, glass, kapton,and the like.

In addition, the optoelectronic properties of a-SiGe:C and a-Ge:H makethem suitable for use with 1550 NM light sources. In particular, thephotovoltaic response of these materials is relatively weak in the 1550NM range (e.g., 1520-1570 NM). However, in applications involving VCSELswith typical unattenuated output power on the order of a few milliwattsper element, enough photocurrent (on the order of 100 nanoamps) isgenerated for use as an optical power monitor. The typical output powerof DFB lasers is even greater. Consequently, at the emission wavelengthsof the devices being monitored, most of the light will be transmittedthrough the PIN layer 312, with a small portion absorbed and convertedinto photocurrent for monitoring the output power of the devices.

The PIN layer or junction 312 consists of an n-doped layer and a p-dopedlayer with a layer of the PIN junction 312 remaining undoped. Althoughdescribed as a PIN junction with the undoped layer being the intrinsiclayer, the layer 312 could also be classified as a p/n junctionstructure as the undoped layer in between the n+ doped layer and the p+doped layer is a depletion region.

After depositing and processing the PIN layer 312, a secondmetallization layer 318 is deposited thereon to complete the firstdetector structure 304. The first detector structure 304 is followed byperiodic structure 308 comprising multiple periodic layers of oxidematerials.

The periodic structure 308 is formed in the shape of a distributed braggreflector (“DBR”) mirror, an etalon, or the like, to function as afine-tuned wavelength filter (and as an OSR in some embodiments such asFIG. 4 below). Those of skill in the art will appreciate, with thebenefit of the present disclosure, that the thickness of each of themultiple periodic layers of the periodic structure 308 determines thewavelength bandpass of the periodic structure 308. Consequently, theperiodic structure 308 can be tuned to a particular wavelength bandpassby using an appropriate thickness for each of the multiple periodiclayers.

After completing the periodic structure 308, the second detector 310 canbe fabricated in the same manner and from the same materials as thefirst detector 304 using low temperature PECVD or some other lowtemperature deposition technique. In one embodiment, a second bufferlayer 306 comprising polyimide, silicon nitride, silicon dioxide, oranother inert material is deposited between the periodic structure 308and the second detector 310. Finally, P and N contacts for each of thedetectors can be formed by channeling thru dielectrically isolatedtrenches, with the metal contacts being formed on heavily dopedchannels.

One skilled in the art will appreciate, with the benefit of the presentdisclosure, that separate monolithic power and wavelength detectors canbe fabricated using the methods and materials described above withrespect to FIG. 3A. Separate power and wavelength detectors can beimplemented in the embodiments of FIGS. 2A and 2B. For instance, thepower detector 206 of FIG. 2A can be fabricated by deposition of a firstbuffer layer 302 on a VCSEL wafer followed by deposition of a firstmetallization layer 316. The first metallization layer 316 can befollowed by a PIN layer or junction 312 and then a second metallizationlayer 318. The deposition of the periodic structure 308, second bufferlayer 306, and second detector 310 can be omitted in this embodiment, asthe wavelength detecting function is provided by the OSR 210 andseparate wavelength detector 207.

The wavelength detector 207 of FIG. 2A can be fabricated by depositionof a first metallization layer 320 on an optical lens wafer, followed bya PIN layer or junction 314 and a second metallization layer 322. Thedeposition of the second buffer layer 306 can be omitted in someembodiments as the first metallization layer 320 can be depositeddirectly on the optical lens wafer depending on the lens material.Additionally, the power detector 304 can be omitted as the powerdetecting function is provided by the power detector 206, and depositionof the periodic structure 308 can be omitted since the OSR 210 includesa periodic structure.

FIG. 3B illustrates a more detailed cross-sectional view of a monolithicdual detector structure 350 that may correspond to the monolithic dualdetector structure 300 of FIG. 3A. In particular, the monolithic dualdetector structure 350 is grown on a 1550 NM VCSEL 351 and includes afirst buffer layer 352, first detector 354, periodic structure 356,second buffer layer 358, and second detector 360. The view of FIG. 3Bfurther illustrates isolating dielectric 362 as well as the contacts foreach of the detectors, including P contact 364 and N contact 366 for thefirst detector 354, and P contact 368 and N contact 370 for the seconddetector 360. As shown, the P and N contacts 364, 366, 368, 370 areformed on heavily doped channels through the isolating dielectric 362.The monolithic detector structure 350 additionally includesanti-reflective (“AIR”) coatings 372, 374, and 376 to reduce backreflections as light propagates through the monolithic detectorstructure 350. As shown, the A/R coatings have been deposited betweenthe first buffer layer 352 and first detector 354, between the firstdetector 354 and the periodic structure 356, and on top of the seconddetector 360.

As with FIG. 3A, the methods and materials discussed with respect toFIG. 3B can be used to fabricate separate power and wavelength detectorstructures. For instance, the power detector structure 206 grown on theVCSEL 202 of FIG. 2A might include a buffer layer 352, first A/R coating372, power detector 354, second A/R coating 374, and P and N contacts364, 366. Alternately or additionally, the wavelength detector structure207 grown on the optical lens 209 of FIG. 2A might include a wavelengthdetector 360, A/R coating 376, and P and N contacts 368, 370.

One of skill in the art will appreciate, with the benefit of the presentdisclosure, that the monolithic dual detector structures 300, 350 and/orseparate monolithic power and wavelength detector structures describedherein can be used as wavelength lockers. In particular, afterfabrication, a monolithic dual detector structure 300, 350 on a 1550 NMVCSEL (or on a lens or other glass substrate) or separate monolithicpower and wavelength detectors can be calibrated to create a lookuptable or calibration file that can be stored in memory of an opticaltransceiver or transponder in which the monolithic dual detectorstructure 300, 350 or separate power and wavelength detector structuresare implemented. During operation, the light source emits light whichpropagates through the first detector 304, 354 and second detector 310,360 where some of the light is absorbed and converted to photocurrentsby the first and second detectors. A microcontroller or other componentuses a ratio of the two photocurrents to determine the wavelength of theemitted light by reference to the lookup table or calibration file. Ifthe wavelength is above or below a desired wavelength, themicrocontroller provides feedback to a temperature control system (e.g.,first and/or second TECs 204, 212 illustrated in FIG. 2A) to increase ordecrease the temperature of the light source (and/or the OSR in a laserwith managed chirp), which results in an increase or decrease in thewavelength of the emitted light.

Alternately or additionally, the photocurrent from the first detector304, 354 can be used to control the output power of the emitted light.In this example, the photocurrent from the first detector 304, 354 isprovided to a microcontroller or other control system. If thephotocurrent is above or below a particular value (corresponding to adesired optical output power), the microcontroller can increase ordecrease the laser bias current to increase or decrease the opticaloutput power.

In one embodiment of the invention, the periodic structure 308, 358 ofthe monolithic detector 300, 350 is adapted to function as a variableoptical attenuator (“VOA”). In this embodiment, metallization layers andelectrical contacts are provided for the periodic structure 308, 358,similar to the metallization layers and electrical contacts provided forthe first and second detectors. In this case, the application of avoltage or current to the periodic structure 308, 358 causes adielectric change to the multiple periodic layers of the periodicstructure 308, 358. By changing the dielectric function of the periodicstructure, the periodic structure is made more or less transmissive,permitting more or less of an emitted optical signal to pass through themonolithic detector structure 300, 350. Thus, an electrically controlledperiodic structure 308, 358 within a monolithic detector 300, 350 can beused to variably attenuate emitted optical signals.

To control the VOA periodic structure 308, 358, control lines can beprovided from the electrical contacts to a microcontroller or othercontrol components. In the case of the transceiver of FIG. 1, the hostcan communicate VOA instructions over the I²C interface to themicrocontroller, and the microcontroller can then apply a current orvoltage to the control lines to change the dielectric function of theperiodic structure and attenuate the emitted optical signal.

Advantageously, the electrically controlled VOA periodic structureenables changing the optical output power of a transmitter withoutchanging the potential performance of the transmitter. For instance, onemethod known in the art for changing the optical output power of atransmitter is to reduce the bias current. However, this method changesthe potential performance of the transmitter. According to the presentembodiment, however, the performance of the transmitter can remainconstant while the transmissivity of the periodic structure is changedin order to attenuate the emitted optical signal.

Turning now to FIG. 4, one embodiment of a compact, hybrid integration,laser with managed chirp 400 is depicted that includes a dual detectorstructure 402 in a design that also incorporates an optical isolator 404and collimating lens 406 for higher performance applications. In thisassembly, a monolithic power detector 408 is located directly on thesurface of a VCSEL 410 and is additionally bonded to an isolatorsubassembly 404 that includes a first linear polarizer 414, latchedgarnet Faraday rotator 416, and second linear polarizer 418. The secondpolarizer 418 is further bonded to a doped glass plate 406 configured toact as an integrated collimating lens, followed by a thin film bandpassfilter or periodic structure 420. At the output of the filter 420, amonolithic wavelength detector 422 is deposited to allow wavelengthlocking control. Van der Vaals bonding can be used at each interfacewhere discrete components are attached. Alternatively, thin epoxybonding can be used. In the present embodiment, the periodic structure420 provides equivalent functionality to the OSR 210, 260 of FIGS.2A-2B, including the facilitation of wavelength detecting,discrimination between 0 bits and 1 bits, and other OSR functionalitydescribed above. Advantageously, the embodiment 400 of FIG. 4 enablessimpler calibration and higher optical performance than the monolithicdual detector structures 300, 350 of FIGS. 3A and 3B due to inclusion ofthe isolator element 404.

As previously explained, separate monolithic detector structures can begrown that include only one detector for monitoring either optical poweror wavelength. In the case of a monolithic detector structure formonitoring only wavelength, a periodic structure may also be included,or the periodic structure can be omitted in embodiments such as FIGS. 2Aand 2B where a periodic structure is provided as part of anothercomponent (such as an OSR) positioned in front of the wavelengthdetector.

The embodiments described herein may include the use of a specialpurpose or general-purpose computer including various computer hardwareor software modules, as discussed in greater detail below.

Embodiments within the scope of the present invention also includecomputer-readable media for carrying or having computer-executableinstructions or data structures stored thereon. Such computer-readablemedia can be any available media that can be accessed by a generalpurpose or special purpose computer. By way of example, and notlimitation, such computer-readable media can comprise RAM, ROM, EEPROM,CD-ROM or other optical disk storage, magnetic disk storage or othermagnetic storage devices, or any other medium which can be used to carryor store desired program code means in the form of computer-executableinstructions or data structures and which can be accessed by a generalpurpose or special purpose computer. When information is transferred orprovided over a network or another communications connection (eitherhardwired, wireless, or a combination of hardwired or wireless) to acomputer, the computer properly views the connection as acomputer-readable medium. Thus, any such connection is properly termed acomputer-readable medium. Combinations of the above should also beincluded within the scope of computer-readable media.

Computer-executable instructions comprise, for example, instructions anddata which cause a general purpose computer, special purpose computer,or special purpose processing device to perform a certain function orgroup of functions. Although the subject matter has been described inlanguage specific to structural features and/or methodological acts, itis to be understood that the subject matter defined in the appendedclaims is not necessarily limited to the specific features or actsdescribed above. Rather, the specific features and acts described aboveare disclosed as example forms of implementing the claims.

As used herein, the term “module” or “component” can refer to softwareobjects or routines that execute on the computing system. The differentcomponents, modules, engines, and services described herein may beimplemented as objects or processes that execute on the computing system(e.g., as separate threads). While the system and methods describedherein are preferably implemented in software, implementations inhardware or a combination of software and hardware are also possible andcontemplated. In this description, a “computing entity” may be anycomputing system as previously defined herein, or any module orcombination of modulates running on a computing system.

The present invention may be embodied in other specific forms withoutdeparting from its spirit or essential characteristics. The describedembodiments are to be considered in all respects only as illustrativeand not restrictive. The scope of the invention is, therefore, indicatedby the appended claims rather than by the foregoing description. Allchanges which come within the meaning and range of equivalency of theclaims are to be embraced within their scope.

What is claimed is:
 1. An optical transmitter incorporating monolithicdetector structures for power and wavelength monitoring, the transmittercomprising: an optical light source configured to emit light in anoptical wavelength range through an emitting surface, the optical lightsource being coupled to a first thermoelectric cooler configured tocontrol the temperature of the optical light source, wherein a change inthe temperature of the optical light source results in a change in thewavelength of light emitted by the optical light source; a firstmonolithic detector structure coupled to the emitting surface of theoptical light source and being positioned along the emission axis of theoptical light source and configured to detect optical output power oflight emitted by the optical light source; a periodic structurepositioned along the emission axis of the optical light source followingthe first monolithic detector structure, the periodic structure beingattuned to a particular wavelength within the optical wavelength rangesuch that the periodic structure is substantially transmissive for lightof the particular wavelength and variably less transmissive for light ofdifferent wavelengths outside of the optical wavelength range; and asecond monolithic detector structure positioned along the emission axisof the optical light source following the periodic structure andconfigured to detect the wavelength of light emitted by the opticallight source.
 2. The optical transmitter of claim 1, wherein theperiodic structure is included within an optical spectrum reshapercoupled to a second thermoelectric cooler configured to control thetemperature of the optical spectrum reshaper, wherein a change in thetemperature of the optical spectrum reshaper results in a change of thebandpass of the optical spectrum reshaper and the particular wavelengthto which the periodic structure is attuned.
 3. The optical transmitterof claim 1, wherein the second monolithic detector structure is coupledto an optical lens following the optical spectrum reshaper.
 4. Theoptical transmitter of claim 1, wherein the optical light sourcecomprises a vertical cavity surface emitting laser and wherein the firstmonolithic detector structure is fabricated on the emitting surface ofthe vertical cavity surface emitting laser along the axis of lightemission, wherein a buffer layer is located between the emitting surfaceand first monolithic detector, the first monolithic detector comprising:a first metallization layer on the buffer layer; a PIN layer or junctionon the first metallization layer; and a second metallization layer onthe PIN layer or junction; and the second monolithic detectorcomprising: a first metallization layer on the optical lens or on an abuffer layer between the optical lens and first metallization layer; aPIN layer or junction on the first metallization layer; and a secondmetallization layer on the PIN layer or junction.
 5. The opticaltransmitter of claim 4, wherein the optical transmitter is implementedin an SFP+ form factor optical transceiver that includes a transmit CDRchip for electrical signal equalization.
 6. The optical transmitter ofclaim 1, further comprising an optical lens disposed between the opticallight source and the periodic structure, wherein the axis of lightemission of the optical light source passes through the optical lens. 7.The optical transmitter of claim 6, wherein the optical light sourcecomprises a vertical cavity surface emitting laser or a distributedfeedback laser and wherein the optical wavelength range is between 1520nanometers and 1570 nanometers.
 8. The optical transmitter of claim 1,wherein the first and second monolithic detector structures include oneor more of: amorphous silicon germanium with carbon doping, andamorphous germanium with hydrogen doping.
 9. The optical transmitter ofclaim 1, wherein photocurrents generated by the first and secondmonolithic detector structures are used in a feedback loop to determineand adjust an emission wavelength of the light emitted by the opticallight source.
 10. The optical transmitter of claim 1, further comprisinga lookup table or calibration file indicative of the wavelength of lightemitted by the optical light source depending on a ratio ofphotocurrents generated by the first and second monolithic detectorstructures.
 11. An optical transmitter incorporating monolithic detectorstructures for power and wavelength monitoring, the transmittercomprising: an optical light source configured to emit light in anoptical wavelength range through an emitting surface, the optical lightsource being coupled to a first thermoelectric cooler configured tocontrol the temperature of the optical light source, wherein a change inthe temperature of the optical light source results in a change in thewavelength of light emitted by the optical light source; a first opticallens positioned long the emission axis of the optical light source sothat light emission from the emitting surface passes through the opticallens; a first monolithic detector structure located on a surface of thefirst optical lens by being grown thereon and being positioned along theemission axis of the optical light source and configured to detectoptical output power of light emitted by the optical light source; aperiodic structure positioned along the emission axis of the opticallight source following the first monolithic detector structure, theperiodic structure being attuned to a particular wavelength within theoptical wavelength range such that the periodic structure issubstantially transmissive for light of the particular wavelength andvariably less transmissive for light of different wavelengths outside ofthe optical wavelength range; and a second monolithic detector structurepositioned along the emission axis of the optical light source followingthe periodic structure and configured to detect the wavelength of lightemitted by the optical light source.
 12. The optical transmitter ofclaim 11, wherein the periodic structure is included within an opticalspectrum reshaper coupled to a second thermoelectric cooler configuredto control the temperature of the optical spectrum reshaper, wherein achange in the temperature of the optical spectrum reshaper results in achange of the bandpass of the optical spectrum reshaper and theparticular wavelength to which the periodic structure is attuned. 13.The optical transmitter of claim 11, wherein the second monolithicdetector structure is coupled to a second optical lens following theoptical spectrum reshaper.
 14. The optical transmitter of claim 13,wherein the optical light source comprises a vertical cavity surfaceemitting laser, the first monolithic detector comprising: a firstmetallization layer on the first optical lens or on an a buffer layerbetween the first optical lens and first metallization layer; a PINlayer or junction on the first metallization layer; and a secondmetallization layer on the PIN layer or junction; and the secondmonolithic detector comprising: a first metallization layer on thesecond optical lens or on an a buffer layer between the second opticallens and first metallization layer; a PIN layer or junction on the firstmetallization layer; and a second metallization layer on the PIN layeror junction.
 15. The optical transmitter of claim 14, wherein theoptical transmitter is implemented in an SFP+ form factor opticaltransceiver that includes a transmit CDR chip for electrical signalequalization.
 16. The optical transmitter of claim 11, furthercomprising an optical lens disposed between the optical light source andthe periodic structure, wherein the axis of light emission of theoptical light source passes through the optical lens and wherein thefirst monolithic detector structure is fabricated on an output surfaceof the optical lens along the axis of light emission.
 17. The opticaltransmitter of claim 16, wherein the optical light source comprises avertical cavity surface emitting laser or a distributed feedback laserand wherein the optical wavelength range is between 1520 nanometers and1570 nanometers.
 18. The optical transmitter of claim 11, wherein thefirst and second monolithic detector structures include one or more of:amorphous silicon germanium with carbon doping, and amorphous germaniumwith hydrogen doping.
 19. The optical transmitter of claim 11, whereinphotocurrents generated by the first and second monolithic detectorstructures are used in a feedback loop to determine and adjust anemission wavelength of the light emitted by the optical light source.20. The optical transmitter of claim 11, further comprising a lookuptable or calibration file indicative of the wavelength of light emittedby the optical light source depending on a ratio of photocurrentsgenerated by the first and second monolithic detector structures.